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Spur-Free Multirate All-Digital PLL for Mobile Phones in 65 nm CMOS
Journal article   Peer reviewed

Spur-Free Multirate All-Digital PLL for Mobile Phones in 65 nm CMOS

Robert Bogdan Staszewski, Khurram Waheed, Fikret Duelger and Oren E. Eliezer
IEEE journal of solid-state circuits, Vol.46(12), pp.2904-2919
01/12/2011

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology

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