Abstract
Stimulated surface- and edge-emissions were investigated for ZnO thin films grown epitaxially by pulsed laser deposition. The lasing threshold was 0.32 MW/cm2 for surface pumping and 0.5 MW/cm2 for edge pumping, which is significantly lower than thresholds observed previously. A modified variable stripe length method was used to measure the gain, which was 1369 cm−1 for the N-band emission. Losses were measured using the shifting excitation spot method and values of 6.2 cm−1 and 6.3 cm−1 were found for the N-band and P-band, respectively. The measured gain and loss were the highest and lowest (respectively) ever reported for ZnO films.