Abstract
The structural, microstructural, and microwave dielectric properties of Ba1-xSrxTi4O9, (0.0 <= x <= 0.06) ceramics samples synthesized by a conventional route were investigated. These structural, microstructural, and dielectric properties were recorded using X-ray diffraction (XRD), scanning electron microscopy (SEM), and Fourier transform infrared (FTIR) and impedance analyzer spectroscopies. Ti-O octahedral distortion was observed due to Sr2+ addition. The microwave dielectric properties were interrelated with various Sr2+ concentrations. Excellent microwave dielectric properties, i.e., high relative permittivity (c(r) = 71.50) and low dielectric loss (tan delta = 0.0006), were obtained.