Abstract
Nanostructured zinc oxide (ZnO) thin film was deposited using immersion method. The molarity was varied in range of 0.02 to 0.10 M in this study. The surface morphology was observed by field emission scanning microscopy (FESEM). Meanwhile, the roughness were characterised by atomic force microscopy (AFM). The current-voltage (I-V) measurement was done to determine its electrical properties. Flake-like morphology was found to increase the electrical properties of nanostructured ZnO thin film. The uniformity was increased when the molarity was increased.