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Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films
Journal article   Peer reviewed

Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

K. B. Li, J. J. Qiu, P. Luo, L. H. An, Z. B. Guo, Y. K. Zheng, G. C. Han, Y. H. Wu and S. J. Wang
Journal of magnetism and magnetic materials, Vol.303(2), pp.E196-E200
01/08/2006

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Condensed Matter Science & Technology Technology

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