Abstract
CdTe thin films of different thicknesses were deposited on polymer substrates for flexible optical devices applications. X-ray diffractogram of different thicknesses for CdTe films are measured and their patterns exhibit polycrystalline nature with a preferential orientation along the (111) plane. The optical constants of CdTe films were calculated based on the measured transmittance spectral data using Swanepoel's method in the wavelength range 400–2500nm. The refractive index n and absorption index k were calculated and the refractive index exhibits a normal dispersion. The refractive index dispersion data followed the Wemple–DiDomenico model based on single oscillator. The oscillator dispersion parameters and the refractive index no. at zero photon energy were determined. The possible optical transition in these films is found to be allowed direct transition with energy gap increase from 1.46 to 1.60eV with the increase in the film thickness. CdTe/flexible substrates are good candidates in optoelectronic devices