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Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor
Journal article   Peer reviewed

Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor

Masatomo Yashima, Makiko Enoki, Takahiro Wakita, Roushown Ali, Yoshitaka Matsushita, Fujio Izumi and Tatsumi Ishihara
Journal of the American Chemical Society, Vol.130(9), pp.2762-2763
05/03/2008
PMID: 18257578

Abstract

Chemistry Chemistry, Multidisciplinary Physical Sciences Science & Technology
MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)(2)(Ni0.74Cu0.21Ga0.05)O4+delta.

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