Abstract
The structural ordering in as-spun and rubbed (then annealed) thin films of poly[(3-hexylmethoxy)thiophene] has been investigated by means of grazing incidence X-ray diffraction (GIXRD) and the results have been compared with the structural data as obtained from XRD on powder samples. In the structure of the as-spun films the thiophene rings in the backbone lie parallel to the plane of the interface with a well-defined separation among the chains of 19
Å. Rubbing the films creates a unique direction in which the domain size is increased, whereas ordering normal to the rubbing direction is greatly diminished, leading to dichroic behavior. Annealing the films at 95 °C seems to have no significant effect on the ordering thereafter.