Abstract
Zn(1-x)CdxO solid solutions with a composition ranging from pure ZnO up to x=0.062 have been grown on ZnO and c-plane sapphire substrates by using metal organic chemical vapor deposition. The optical transmission spectra were used to estimate the cadmium mole fraction of the solid solutions. The lattice deformation and morphology of these films were examined in detail using high resolution X-ray diffraction and atomic force microscopy as Cd incorporation and used substrate. Our study reveals significant lattice deformation from x >= 0.7%. The atomic force microscopy images show facetted grains for films grown on ZnO substrate but rather round for c-plane sapphire substrate. The grain shape is controlled by the presence of the ionic charges on the polar surface of ZnO which is disturbed by cadmium incorporation and also the employed substrate material. (C) 2011 Elsevier B.V. All rights reserved.