Abstract
This research paper describes the non-isothermal crystallization during phase transformation in Se75Te25-xInx glasses synthesized by melt quenching method. For crystallization studies in these glasses, non-isothermal differential scanning calorimetry (DSC) measurements was done at constant heating rates of 5, 10, 15, 20 and 25 K min−1 in air atmosphere. The glass transition temperature (Tg), on-set crystallization temperature (Tc), peak crystallization temperature (Tp) and melting temperatures (Tm) were derived by DSC thermograms. Using various thermal parameters the activation energy of glass transition and crystallization were determined by using Kissinger, Moynihan and Ozawa approaches and found to be in good agreement. The value of the activation energy of glass transition (ΔEt) was found to be minimum for Se75Te19In6 alloys confirming its maximum probability of transition in a metastable state. Thermal stability parameters of Se75Te25-xInx were determined and found to be increased with indium content. High resolution x-ray diffraction and field emission scanning electron microscopy studies were employed for the study of phase transformation in Se75Te25-xInx glasses. The outcome of these studies shows that the investigated materials may be suitable for phase change memory devices.