Abstract
Multilayer films of cadmium 22-tricosenoiate were deposited by using the Langmuir-Blodgett technique in the Z-mode of deposition. The films were then irradiated with various gamma-irradiation doses. Small-angle X-ray diffraction patterns of the films before and after gamma-irradiation were studied by applying the model of diffraction by a few slits. The X-ray diffraction patterns of the films before gamma-irradiation show nine equidistant peaks, indicating the presence of a regular periodic structure in the film. The intensities of the even-order diffraction peaks are relatively less than those from the neighbouring odd-order peaks. This phenomenon, known as even-odd intensity oscillation, was successfully explained by this model. The position of the X-ray diffraction peaks taken for films after different gamma-irradiation doses does not change, indicating that the average spacing in the film is unaffected by gamma-irradiation. However, the intensity of the diffraction peaks of the film does change with gamma-irradiation dose. This change can be explained by the change of electron density along the molecular chain in the layer before and after various gamma-irradiation doses. (C) 1997 Elsevier Science Ltd. All rights reserved.