Abstract
SnO
2
and SnS
2
thin films have been prepared by the spray pyrolysis technique for photovoltaic application purposes and characterized by high-frequency acoustic microscopy (570 MHz).The surface acoustic images reveal contrasts explained by differences in topography according to atomic force microscopy studies. The acoustic signature V(z) of the systemslayer/substrate were modelled and refined to fit with the experimental V(z). The acoustic parameters of the layers were calculated using the results of the final simulation. The values of Young's modulus deduced from the acoustic parameters, 401 and 56 GPa for SnO
2
and SnS
2
, respectively, are discussed in relation with the chemical structure and bonding involved. PACS Nos.: 43.35Ns and 62.65