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Sub-15-nm patterning of asymmetric metal electrodes and devices by adhesion lithography
Journal article   Open access  Peer reviewed

Sub-15-nm patterning of asymmetric metal electrodes and devices by adhesion lithography

David J. Beesley, James Semple, Lethy Krishnan Jagadamma, Aram Amassian, Martyn A. McLachlan, Thomas D. Anthopoulos and John C. deMello
Nature communications, Vol.5(1), pp.3933-3933
27/05/2014
PMCID: PMC4050269
PMID: 24861953

Abstract

url
https://doi.org/10.1038/ncomms4933View
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