Surface and bulk conductivity measurements on amorphous silicon thin films

Journal article

Peer reviewed

M. S Aida, S Boudjaadar, A Chari and L Mahdjoubi

Thin solid films, Vol.207(1-2), pp.1-3

01/01/1992

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures

Electronic transport phenomena in thin films and low-dimensional structures

Exact sciences and technology

Physics

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Title: Surface and bulk conductivity measurements on amorphous silicon thin films
Creators - without role: M. S Aida - Univ. Constantine, unité rech. physique matériaux applications, Constantine 25000, Algeria
S Boudjaadar - Univ. Constantine, unité rech. physique matériaux applications, Constantine 25000, Algeria
A Chari - Univ. Constantine, unité rech. physique matériaux applications, Constantine 25000, Algeria
L Mahdjoubi - Univ. Constantine, unité rech. physique matériaux applications, Constantine 25000, Algeria
Publication Details: Thin solid films, Vol.207(1-2), pp.1-3
Publisher: Elsevier Science
Identifiers: 9940102508331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article