Abstract
About 60 samples of various materials exposed to low Earth orbit (LEO) conditions for 997 days on board the orbital space station 'Mir' were investigated. The aim was to determine the properties of the contamination layers formed during LEO exposition.
The following methods were used: optical and scanning electron microscopy, local x-ray microanalysis, secondary ion mass spectrometry in fast atom bombardment ionization mode, electron spectroscopy for chemical analysis, temperature programmed desorption mass spectrometry, x-ray phase analysis, spectral reflectance, solar absorbance and relative emittance measurements.
Two effects were observed for all samples: the formation of contamination deposits and the erosion of the substrate-original surface. The relative contribution of both effects changes depending on the sample type and on exposure conditions. The deposit thickness varies on the sample surface over a very wide range (at least five decimal orders of magnitude), changing, from values exceeding 100 Mm to values of less than 2 nm (possibly these regions do not contain any deposit at all).
The main element of contamination is silicon; the others are potassium and calcium. Evidence of a chemical reaction between the Teflon FEP substrate and the contamination was observed.