Surface morphology and interface structural analyses of Ti(film)/SiC(substrate) by PEEM, SXES, AES and XRD

Journal article

Peer reviewed

Joselito Labis, Akihiko Ohi, Masaaki Hirai, Masahiko Kusaka and Motohiro Iwami

Surface and interface analysis, Vol.35(1), pp.89-93

01/2003

Abstract

PEEM

photoemission

SiC

soft x-ray emission

SXES

Ti5Si3

TiC

1 Record Views

Title: Surface morphology and interface structural analyses of Ti(film)/SiC(substrate) by PEEM, SXES, AES and XRD
Creators - without role: Joselito Labis - Okayama University
Akihiko Ohi - Okayama University
Masaaki Hirai - Okayama University of Science
Masahiko Kusaka - Okayama University of Science
Motohiro Iwami - Okayama University of Science
Publication Details: Surface and interface analysis, Vol.35(1), pp.89-93
Publisher: John Wiley & Sons, Ltd
Number of pages: 5
Identifiers: 9946430708331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article