Abstract
Thin films of Se35Te65-xGex (x = 0, 3, 6, 9, 12) nanoparticles were synthesized using thermal evaporation method. They were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), and absorption and transmission spectra. XRD results show that these films are of amorphous nature, while SEM images show nanoparticles with average particle size around 30 nm. No significant changes are observed in morphology of the deposited films by changing concentrations of Te and Ge. The optical behaviors of these films have been studied using the absorption and transmission spectra in the spectral region 400-1100 nm. The absorption, extinction coefficients and refractive index were obtained and investigated in more detail. The optical band gap (E-g) values were also determined and are found to decrease from 0.83 to 0.69 eV by increasing the concentration of Ge from 0 to 12. The transmission spectra for the thin films of Se35Te65-xGex nanoparticles show strong absorption at wavelength less than 500 nm and become highly transparent at wavelength above 800 nm. No significant changes in the transmission spectra are observed by increasing concentration of Ge. These results might be useful for development of optical disks and other semiconducting devices based on these nanochalcogenides.