Abstract
Nearly stoichiometric thin films of the ternary AgSbSe2 compound have been deposited at room temperature by conventional thermal evaporation of the presynthesized material onto glass substrate. The X-ray and electron diffraction studies revealed that the as-deposited films are amorphous in nature, while an amorphous-to-crystalline phase transition could be obtained by thermal annealing at 373 K. The elemental chemical composition of asdeposited films was confirmed using the energy dispersive X-ray analysis. The transmission spectra of the as-deposited and annealed films were recorded at normal light incidence in the wavelength range 600-2500 nm. The refractive index and optical band gap have been calculated for the investigated films. The dispersion parameters, (E-o, E-d) static refractive index n(s)(0), static dielectric constant, epsilon(s) and the carrier concentration to the effective mass ratio, N/m* have been calculated. An analysis of the optical absorption spectra revealed anon direct optical transition characterizing the as-deposited films and those annealed at 343 and 374 K while; direct and indirect optical transitions characterized the films annealed at 398 K.