THE USEFULNESS OF A 400 KV HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPE

Journal article

Peer reviewed

Y Bando, Y Matsui, Y Uemura, T Oikawa, S Suzuki, T Honda and Y Harada

Ultramicroscopy, Vol.18(1-4), pp.117-123

01/01/1985

Abstract

Microscopy

Science & Technology

Technology

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Title: THE USEFULNESS OF A 400 KV HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPE
Creators - without role: Y Bando - National Institute for Materials Science
Y Matsui - National Institute for Materials Science
Y Uemura - National Institute for Materials Science
T Oikawa - JEOL
S Suzuki - JEOL
T Honda - JEOL
Y Harada - JEOL
Publication Details: Ultramicroscopy, Vol.18(1-4), pp.117-123
Publisher: Elsevier
Number of pages: 7
Identifiers: 9952552908331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article