TIME-DEPENDENT MOS GATE OXIDE DEFECTS USING LIQUID-CRYSTALS

Journal article

Peer reviewed

Journal of the Electrochemical Society, Vol.127(4), pp.932-936

01/04/1980

Abstract

Electrochemistry

Materials Science

Materials Science, Coatings & Films

Physical Sciences

Science & Technology

Technology

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Title: TIME-DEPENDENT MOS GATE OXIDE DEFECTS USING LIQUID-CRYSTALS
Creators - without role: AKM Zakzouk
Publication Details: Journal of the Electrochemical Society, Vol.127(4), pp.932-936
Publisher: Electrochemical Soc Inc
Number of pages: 5
Identifiers: 9952749008331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article