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Temperature and frequency dependencies of AC and dielectric characterizations of copper tetraphenyl porphyrin thin films
Journal article   Peer reviewed

Temperature and frequency dependencies of AC and dielectric characterizations of copper tetraphenyl porphyrin thin films

M. M. El-Nahass, A. A. M. Farag, F. S. H. Abu-Samaha and Eman Elesh
Vacuum, Vol.99, pp.153-159
01/01/2014

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Science & Technology Technology

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