Abstract
Reduced graphite oxide (GO) has shown promise as a scalable alternative to mechanically exfoliated specimens. Although many measurements show that reduced GO has properties approaching those of pristine graphene, it has been difficult to quantify the extent to which the graphitic network is restored upon reduction. Raman spectroscopy is widely used for the characterization of mechanically exfoliated graphene, but has not been fully explored for reduced GO. In this work, hydrazine suspensions of reduced GO are deposited on micro-hot-plates and examined over a range of temperatures by Raman spectroscopy. The work highlights the benefits of solution processing.