Abstract
In this paper, we investigate a new composite that consists of ferrites nanoparticles on porous silicon. Ferrites of cobalt nanoparticles (CoFe2O4) were embedded using spin coating method into porous Silicon (PSi) which is prepared by electrochemical etching of p-type Si (1 0 0) wafers.
Scanning electron microscopy (SEM) and X-Ray diffraction (Cu-Kα radiation) results has shown the presence of nanoparticles with crystallite sizes about 7–9 nm. The SEM Image CoFe2O4 nanoparticles spin coated on p-type porous silicon shows that most of the particles are aggregated and exhibit a compact arrangement of the nanoparticles with roughly spherical shape. Nonetheless, X-Ray diffraction results have shown that the film have a good crystalline quality.
For the optical properties of the composite, it will be studied using various techniques such as ellipsometry and Reflectance by a UV–VIS spectrophotometer. The reflectance study illustrates the ability of the nanoparticles dispersion to produce optical antireflection properties on the porous silicon. We also deduce that the reflectance of the nanoparticles dispersed on porous Si is higher than the reflectance of the nanoparticles dispersed on Si wafer; it is in fact due to the enormous number of nucleation sites in the case of porous Si. The optical parameters such the refractive index and the extinction coefficient were determined using the ellipsometry spectroscopy.