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The microstructural analysis of SiC nanorods by high-resolution electron microscopy
Journal article

The microstructural analysis of SiC nanorods by high-resolution electron microscopy

Y. H. Gao, Y. Bando, K. Kurashima and T. Sato
Journal of electron microscopy, Vol.49(5), pp.641-649
2000
PMID: 11110470

Abstract

axis direction diameter high-resolution electron microscopy SiC nanorods stacking faults

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