Abstract
This work presents a simple method based on electrical and thermal properties of materials. It permits researchers, in the field of manufacturing and characterization of thin and thick films in solid state to take appropriate experimental conditions before the preparation process. The calculation of the thermal diffusion length, its comparison with thicknesses of the substrate, the thin layer deposited on the substrate, the use of photothermal deflection technique, and the Cahill's law permit to highlight the necessary conditions that allow researchers to manufacture samples with high thermoelectric power such as the required thickness, electric conductivity, and thermal conductivity.