Abstract
Thin films of basic fuchsine, BF, are prepared by thermal evaporation technique. The data of thermal gravimetric analysis, TGA, showed that BF has a thermal stability up to the temperature of 265 C. The structural characteristics of BF thin films are investigated by using X-ray diffraction, and atomic force microscope techniques. BF is polycrystalline in powder form; it becomes nanocrystallites in thin film condition. Annealing temperatures decreased crystallites size and influenced optical constants of BF films. Optical constants of BF films were estimated by using spectrophotometer measurements of transmittance and reflectance in the spectral range from 190 to 2500 nm. The dependence of absorption coefficient on the photon energy and annealing temperatures was determined and the analysis of the results showed that the optical transition in BF films is indirect allowed one. The onset and fundamental energy gap of BF thin films are 1.91 and 3.72 eV, respectively and they decrease by annealing temperatures. The optical dielectric constants and dispersion parameters of BF thin film are calculated and showed remarkable dependence on photon energy and annealing temperatures. (C) 2015 Elsevier B.V. All rights reserved.