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Thickness dependence of switching time and coercive field in ferroelectric thin films
Journal article   Peer reviewed

Thickness dependence of switching time and coercive field in ferroelectric thin films

Ahmad Musleh Alrub and Lye-Hock Ong
Journal of applied physics, Vol.109(8), pp.084109-084109-6
15/04/2011

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Physical Sciences Physics Physics, Applied Science & Technology

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