Threshold voltage calculation in ultrathin-film SOI MOSFETs using the effective potential

Journal article

Peer reviewed

Stephen M Ramey and David K Ferry

IEEE transactions on nanotechnology, Vol.2(3), pp.121-125

01/09/2003

Abstract

Applied sciences

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Transistors

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Title: Threshold voltage calculation in ultrathin-film SOI MOSFETs using the effective potential
Creators - without role: Stephen M Ramey - Arizona State University
David K Ferry - Arizona State University
Publication Details: IEEE transactions on nanotechnology, Vol.2(3), pp.121-125
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9948325408331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article