Sign in
Towards improved quantitative analysis using surface-enhanced Raman scattering incorporating internal isotope labelling
Journal article   Peer reviewed

Towards improved quantitative analysis using surface-enhanced Raman scattering incorporating internal isotope labelling

Abdu Subaihi, Yun Xu, Howbeer Muhamadali, Shaun T. Mutter, Ewan W. Blanch, David I. Ellis and Royston Goodacre
Analytical methods, Vol.9(47), pp.6636-6644
01/01/2017

Abstract

Metrics

1 Record Views

Details