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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
Journal article   Open access  Peer reviewed

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level

Yassir Arezki, Rong Su, Ville Heikkinen, Francois Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, …
Sensors (Basel, Switzerland), Vol.21(4), pp.1-19
05/02/2021
PMID: 33562598

Abstract

Chemistry Chemistry, Analytical Engineering Engineering, Electrical & Electronic Instruments & Instrumentation Physical Sciences Science & Technology Technology
url
https://doi.org/10.3390/s21041103View
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