Abstract
In this paper, a symmetrical MIM tunnel junction diode with a novel material combination, vanadium–vanadium sequioxide–vanadium (V–V
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–V) is fabricated and electrically characterized. Analysis of the measured current-voltage ([Formula: see text]–[Formula: see text] characteristics of the fabricated MIM diode revealed an ultra-high diode sensitivity of [Formula: see text]9.24[Formula: see text][Formula: see text] at an applied bias of [Formula: see text]0.104[Formula: see text]V. Based on the measured [Formula: see text]–[Formula: see text] characteristics, theoretical predictions were performed showing that the diode’s dynamic resistance can be tuned for matching to coupled antennas, in rectenna structures, whilst maintaining high levels of sensitivities using practically realizable V
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insulator thicknesses.