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Ultraviolet Light-Based Current-Voltage Method for Simultaneous Extraction of Donor- and Acceptor-Like Interface Traps in \beta -Ga2O3 FETs
Journal article   Peer reviewed

Ultraviolet Light-Based Current-Voltage Method for Simultaneous Extraction of Donor- and Acceptor-Like Interface Traps in \beta -Ga2O3 FETs

Hagyoul Bae, Jinhyun Noh, Sami Alghamdi, Mengwei Si and Peide D. Ye
IEEE electron device letters, Vol.39(11), pp.1708-1711
11/2018

Abstract

<italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">β -Ga₂O₃ FET acceptor-like trap states Data mining differential ideality factor donor-like trap states Electron traps Fabrication Field effect transistors Logic gates Photonic band gap photonic current Photonics power device sub-threshold current wide bandgap

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