Abstract
The VST3331 titanium alloy in three structural states with different dispersities of the secondary α phase of titanium has been investigated by scanning electron microscopy and X-ray diffraction analysis. The possibility of using full-profile analysis of X-ray diffraction patterns for determining the size of titanium secondary α-phase crystallites has been estimated. It is demonstrated that the methods in use yield similar estimates of the average thickness of titanium secondary α-phase plates.