Sign in
Value-at-Risk-Based Two-Stage Fuzzy Facility Location Problems
Journal article

Value-at-Risk-Based Two-Stage Fuzzy Facility Location Problems

Shuming Wang, Junzo Watada and Witold Pedrycz
IEEE transactions on industrial informatics, Vol.5(4), pp.465-482
01/11/2009

Abstract

Automation & Control Systems Computer Science Computer Science, Interdisciplinary Applications Engineering Engineering, Industrial Science & Technology Technology

Metrics

1 Record Views

Details