X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film

$X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film$

Journal article

Peer reviewed

Lamartine Meda, Klaus H Dahmen, Saleh Hayek and Hamid Garmestani

Journal of crystal growth, Vol.263(1-4), pp.185-191

01/03/2004

Abstract

Condensed matter: structure, mechanical and thermal properties

Deformation and plasticity (including yield, ductility, and superplasticity)

Exact sciences and technology

Mechanical and acoustical properties of condensed matter

Mechanical properties of solids

Physics

Structure and morphology; thickness

Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)

Thin film structure and morphology

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Title: X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film
Creators - without role: Lamartine Meda - Georgia Institute of Technology
Klaus H Dahmen - Georgia Institute of Technology
Saleh Hayek - Georgia Institute of Technology
Hamid Garmestani - Georgia Institute of Technology
Publication Details: Journal of crystal growth, Vol.263(1-4), pp.185-191
Publisher: Elsevier
Identifiers: 9933901208331
Academic Unit: University of Tabuk
Language: English
Resource Type: Journal article