XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium

Journal article

Peer reviewed

Nimer Wehbe, Jean-Jacques Pireaux and Laurent Houssiau

Journal of physical chemistry. C, Vol.118(46), pp.26613-26620

20/11/2014

Abstract

Chemistry

Chemistry, Physical

Materials Science

Materials Science, Multidisciplinary

Nanoscience & Nanotechnology

Physical Sciences

Science & Technology

Science & Technology - Other Topics

Technology

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Title: XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium
Creators - without role: Nimer Wehbe - University of Namur
Jean-Jacques Pireaux - University of Namur
Laurent Houssiau - University of Namur
Publication Details: Journal of physical chemistry. C, Vol.118(46), pp.26613-26620
Publisher: Amer Chemical Soc
Number of pages: 8
Identifiers: 9944459608331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article