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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Journal article   Open access  Peer reviewed

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Mario Lanza, Quentin Smets, Cedric Huyghebaert and Lain-Jong Li
Nature communications, Vol.11(1), pp.5689-5689
10/11/2020
DOI: https://doi.org/10.1038/s41467-020-19053-9
PMCID: 7655834
PMID: 33173041

Abstract

Multidisciplinary Sciences Science & Technology Science & Technology - Other Topics
The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
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https://doi.org/10.1038/s41467-020-19053-9View
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