Abstract
The main objective of this study is presentation of a new version of ZXCOM software that can calculate the effective atomic number
, the effective electron density
, and the elastic (Rayleigh) to inelastic (Compton) scattering ratio
, for any element, compound, or mixture at energies from 1 keV to100 GeV, over an interval of scattering angles extending from 0° to 180°. The ZXCOM runs under the MS Windows
®
operating system. It provides a useful interface that simplifies defining and redefining materials and experimental conditions. As an application of ZXCOM software, the
and
of some thick metal-oxide films, TMOFs (In
2
O
3
, WO
3
, Nb
2
O
5
, Cr
2
O
3
, SmCoO
3
, NiO, ZnO, Zn
2
SnO
4
, SnO
2
, CeO
2
, SmFeO
3
, TiO
2
, and LiCoO
2
), were calculated. The software created in this study can be used as a reliable and fast tool for the determination of the above parameters that are essential in a wide range of applications such as radiation shielding, radiotherapy, technology, etc.