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FTIR and AFM studies of the Ge on Porous Silicon/Si substrate hetero-structure obtained by molecular beam epitaxy
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FTIR and AFM studies of the Ge on Porous Silicon/Si substrate hetero-structure obtained by molecular beam epitaxy

S. Gouder, R. Mahamdi, M. Aouassa, S. Escoubas, L. Favre, A. Ronda and I. Berbezier
HAL CCSD
01/01/2014

Abstract

Condensed Matter Physics
International audience

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