Low Frequency Noise Sources in Ge Resistances elaborated on GeOI Wafers

Other

Peer reviewed

J. Gyani, S. Soliverès, Frédéric Martinez, M. Valenza, C. Le Royer and E. Augendre

AIP Conference Proceedings, Vol.1129, pp.105-108

AIP

01/01/2009

Abstract

Electronics

Engineering Sciences

International audience

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Title: Low Frequency Noise Sources in Ge Resistances elaborated on GeOI Wafers
Creators - without role: J. Gyani
S. Soliverès
Frédéric Martinez
M. Valenza
C. Le Royer
E. Augendre
Publication Details: AIP Conference Proceedings, Vol.1129, pp.105-108
Publisher: AIP
Identifiers: 9918108208331
Academic Unit: Majmaah University
Language: English
Resource Type: Other